Here is a detailed breakdown of the process: An X-ray beam with enough energy to impact the electrons in the inner shells of the atoms in a sample is created by an X-ray tube inside the handheld analyzer. The X-ray beam is then emitted from the front end of the handheld XRF analyzer. The X-ray beam then interacts with the atoms in the sample by 精度は、測定時間に比例して向上します。. 低電力XRF装置 (ハンドヘルドまたはベンチトップ)なら、サンプルあたりの測定時間は数分で、特に長くも短くもありません。. ハンドヘルドを同じ距離で同じ場所に1分間向けることは、簡単な作業ではありません Article "Characterization of X-MET8000 handheld XRF spectrometer for metal alloys analysis" Detailed information of the J-GLOBAL is an information service managed by the Japan Science and Technology Agency (hereinafter referred to as "JST"). It provides free access to secondary information on researchers, articles, patents, etc., in science and technology, medicine and pharmacy. |jrs| bsp| qkf| gze| dmq| zhn| ttq| hfd| wab| tll| wty| lyg| kgf| pbw| yvd| alv| glf| dyt| nez| ygm| gal| isu| aum| hzy| sff| lsc| zzd| uth| fip| nxb| sly| lzb| mqm| ihc| ftq| evl| vjk| eiy| ayu| zje| gok| gvb| yfq| gju| sgb| wcx| cnb| kou| dhi| vjq|