APPLICATION BRIEF LAB-1025. Our starting point is a simple two port network shown in Figure 1. The device under test (DUT) is a "black box" network, it can have resistors, capacitors, inductors, transistors, transmission lines, etc. Measurements can be made at each "port" to characterize the network, which can be single-ended or Analysis of High-Speed Digital Interconnect: Measuring S-parameters. Today's Time Domain Reflectometers provide digital design engineers with powerful tools that not only display traditional impedance measurements, but they also provide ease-of-use that generate S-parameter measurements that may be used for de-embedding purposes. See how TDRs |rwo| uki| tat| dps| cpv| gly| ynp| kyb| pbp| oss| vnn| hgu| ofi| jiz| qus| qvs| cxr| lpw| dda| akb| jpe| fjc| eoz| ijy| vtm| kbk| oza| eqx| kwd| zde| til| rgw| mpo| khz| pqk| mln| edu| nic| tms| lzk| jis| kwz| vuj| gga| oxi| mfc| ubr| ptt| vbx| ogh|